News
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10.10.2019
Representatives of Epiel JSC took part in The 5th Anniversary International Forum «Microelectronics 2019»
The 5th Anniversary International Forum «Microelectronics 2019» held place from 30th of Septeber to 5th of October 2019. As part of the program representatives of Epiel JSC presented report on «Formation of an AlN Transition Layer on 3C-SiC / Si (111) Templates by Ammonia Molecular Beam Epitaxy» and «Effect of solid-state recrystallization with double implantation on the density of structural defects in ultrathin silicon layers on sapphire epitaxy».